Abstract
AbstractWe report on our investigation of the microstructure and chemical composition at the CdTe/Te-rich interfaces generated by NP-etching polycrystalline and single-crystalline CdTe films and followed with HgTe-graphite pasting and thermal annealing. We find that after this process, a thin layer of CdxHg1-xTe forms between CdTe and Te-rich layers, giving a structure like CdTe/CdxHg1-xTe/Te. High-resolution electron microscopy reveals that the CdxHg1-xTe layer has an epitaxial relationship with the CdTe. No CdxHg1-xTe layer has been observed in bromine/methanol-etched samples or samples with intentionally deposited Te layers.
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