Abstract
Heat-resistant two-dimensional (2D) sphere/hemisphere shell array is significant for the fabrication of novel nanostructures. Here large-area, well-ordered arrays of carbonized polystyrene (PS) hollow sphere/hemisphere with controlled size and morphology are prepared by combining the nanosphere self-assembly, kV Ag ion beam modification, and subsequent annealing or chloroform treatment. Potential mechanisms for the formation and evolution of the heat-resistant carbonized PS spherical shell with increasing ion fluence and energy are discussed. Combined with noble metal or semiconductor, these modified PS sphere arrays should open up new possibilities for high-performance nanoscale optical sensors or photoelectric devices.
Highlights
Ion beam irradiation is one of the most powerful and well-known methods to modify the surface properties and topography of materials[16,17,18]
We present a systematic investigation of the influence of the ion-irradiation parameters on the morphology and structure of PS microsphere array
We only show the research results of PS microspheres 820 nm in initial diameter below, even though we have obtained the similar results for 430 nm PS microspheres
Summary
Xianyin Song[1], Zhigao Dai[1], Xiangheng Xiao[1,5], Wenqing Li1, Xudong Zheng[1], Xunzhong Shang[2], Xiaolei Zhang[1], Guangxu Cai[1], Wei Wu3, Fanli Meng4 & Changzhong Jiang[1]. Large-area, well-ordered arrays of carbonized polystyrene (PS) hollow sphere/hemisphere with controlled size and morphology are prepared by combining the nanosphere self-assembly, kV Ag ion beam modification, and subsequent annealing or chloroform treatment. Materials (e.g. PS, polymethylmethacrylate (PMMA)) are irradiated by a high-energy ion beam, some complex physico-chemical reactions will happen simultaneously, such as the effect of heat deposition, carbonization or cross-linking, surface sputtering effect, etc[19,20,21,22]. These reactions make organic polymer undergo drastic changes in morphology, composition and physicochemical properties. The microstructural characterizations were performed using a JEOL 2010 (HT) transmission electron microscope (TEM) operating at 200 kV
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