Formation of atomic point contacts and molecular junctions with a combined mechanical break junction and electrodeposition method

Abstract

A method to create atomic point contacts and molecular junctions by combining mechanically controlled break junction and electrochemical deposition/etching techniques is described. This approach provides both stability and flexibility, and is suitable for studying electron transport properties of single molecule junctions or atomic point contacts in aqueous solutions and under potential control. Using the approach, the electron transport properties of 4,4′-bipyridine as a function of electrochemical gate and Ni point contacts have been studied.