Abstract
We investigated the formation of an AuSi eutectic from a silicon (100) surface cleaned under ultrahigh vacuum conditions and an evaporated 3-nm-thick gold layer using a suite of surface-sensitive x-ray techniques and Auger spectroscopy. The signature of the presence of the eutectic liquid came from its recently discovered surface-ordered state, whose diffraction pattern is confirmed. As expected, the eutectic started to form at its melting temperature $(380\text{ }\ifmmode^\circ\else\textdegree\fi{}\text{C})$, but a small change in the film thickness was detected beforehand. The surface-ordered state was found to disappear at $T=473\text{ }\ifmmode^\circ\else\textdegree\fi{}\text{C}$ without the appearance of a second phase, but also to persist after resolidification of the liquid. Subsequent electron and x-ray microscopy after the sample was removed from vacuum showed the presence of phase-separated gold in the form of micronsized crystals on the surface.
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