Abstract
The growth mode and electronic properties of ultrathin films of silver deposited at room temperature (RT) on a 9 monolayers (ML) pseudomorphic Mn film on a Ag(001) surface have been studied by means of low energy electron diffraction (LEED), X-ray photoelectron diffraction (XPD) and angle-resolved ultraviolet photoemission (ARUPS). In particular ARUPS was used to investigate the valence band structure. Initially the data show some Ag segregation on top of the Mn film grown at RT. In the 0.5–0.9 ML coverage range the Ag adlayer exhibits d-band spectral behavior characteristic of two-dimensional dispersion. Further evaporation of Ag results in the formation of Ag bilayer platelets, and > 3 ML deposition the system exhibits a three-dimensional electronic structure converging towards a bulk Ag(001)-like system. Thus the growth mode of Ag on the Mn film is found to be nearly layer by layer up to 2 ML.
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