Abstract
We analyzed Zn-doped SnTe-based thermoelectric materials via transmission electron microscopy (TEM). The high-resolution TEM micrographs showed a doublet periodicity of the {1 1 1} lattice planes and the corresponding fast Fourier transform patterns revealed two sets of superstructure reflections having symmetrical intensity. The TEM results indicated the existence of a partially ordered CuPt-type structure in the Sn1–xZnxTe matrix; twinning bands were also observed in some regions.
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