Abstract
The influence of single failures on the operation of digital devices is considered. Single events and their classification are considered. A generalized function for ensuring fault tolerance in the design of integrated circuits is introduced. The implementation of these methods is shown on the example of a microprocessor chip.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
