Abstract

The formation mechanism for typical onion ring structure and void defect with heat input during FSLW was continuously visualized by an exit-hole continuous observation technique. Based on this result, the compatibility between microstructure, microtexture, element maps and strain maps using electron backscattered diffraction (EBSD) with the chemical indexing assisted by EDS analysis was simultaneously investigated. The results revealed that the threaded probe was significantly correlated to typical onion ring structure and the onion structure formed as soon as it touched the probe. This result is different from the results so far. On the other hand, the remnant of original interface between top and bottom plates after FSLW and asymmetrical flow around rotating tool were significantly correlated to the formation of void defect in low heat input condition.

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