Abstract
The formation of electron internal transport barriers (ITBs) was studied using electron cyclotron (EC) heating in JT-60U positive shear (PS) and reversed shear (RS) plasmas with scan of neutral beam (NB) power. With no or low values of NB power and with a small radial electric field (Er) gradient, a strong, box-type electron ITB was formed in RS plasmas while a peaked profile with no strong electron ITBs was observed in PS plasmas within the available EC power. When the NB power and the Er gradient were increased, the electron transport in strong electron ITBs with EC heating in RS plasmas was not affected, while electron thermal diffusivity was reduced in conjunction with the reduction of ion thermal diffusivity, and strong electron and ion ITBs were formed in PS plasmas.
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