Abstract

This study combined proximal sensors and soil analyses for the assessment of a 4.5-m deep Oxisol representative of southeastern Brazil. The soil was derived from gneiss. Soil samples were collected in a 20 × 20 cm grid design across the profile wall, analyzed for texture and chemical properties, and scanned by visible near infrared diffuse reflectance spectroscopy (Vis-NIR DRS), portable X-ray fluorescence spectrometry (pXRF), and X-ray diffraction (XRD). Total elemental contents by pXRF analyses were mapped to provide 2D elemental content maps. The elemental contents revealed alternating patterns in the C horizon attributed to the mafic and felsic bands of the gneiss. The extremely low exchangeable/available nutrient contents in the C horizon are remarkable. Profile maps showed Si accumulation downwards and relative Fe and Al accumulation in the upper horizons indicating desilication and intense weathering. Vis-NIR DRS spectra differentiated horizons and detected mineralogy traits. Vis-NIR DRS data correlated well with XRD data, strengthening its potential for assessing soil mineralogy. Proximal sensors can detect variations of soil properties in apparently homogeneous soil profiles, and improve studies of soil genesis.

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