Abstract
Reaction of nanocrystalline lutetium oxide with amorphous SiO 2 was studied at 600–1200 °C with X-ray powder diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), Fourier transform infrared spectroscopy (FT-IR), FT-Raman spectroscopy and Yb 3+ emission spectroscopy. It has been shown that up to loading corresponding to ca. 10 μmol Lu 2O 3/1 m 2 SiO 2, Lu can be dispersed over SiO 2 as an amorphous, nanometre thick Lu–O–Si layer. At 1000 °C formation of crystalline silicate, isomorphous with B-type Ln 4[Si 3O 10][SiO 4] (Ln Dy–Tm) was observed. It has been shown that emission bands of Yb 3+, introduced as contamination present in Lu 2O 3, appearing in anti-Stokes region of Raman spectra, could be used as convenient tool for identification of the Lu-phases formed in the samples.
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