Abstract
The reject rate of LSI chips due to incomplete fault coverage of the tests is the fraction of faulty chips among the chips that pass the tests. This reject rate, which is a measure of the tested chip quality, contributes to the field returns. It is, however, difficult to determine the tested chip quality from the field return data which may also include rejects due to handling damages, infant mortality, etc. Also, a large number of chips must be in use in the field before an adequate amount of field return data can be obtained. This paper gives a method of forecasting the reject rate from the test data alone before any field trials are made.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
