Abstract
In this manuscript, the force exerted on the dielectric in the fringe field from the two conducting parallel plates with applied electrical potential was calculated and found to be an effective micro/nanoscale manipulation tool. The conformal mapping was employed to obtain the fringe field generated from the edges of the plates. The strong gradient of the fringe field near the edges was manifested in both parametric mapping and simulation. It was found that the force analytically obtained from the fringe field was proportional and directed to the gradient of the squared electric field. The result was compared to dielectrophoresis (DEP).
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