Abstract

Semiconductor photolithography equipment requires an actuation system that can satisfy high acceleration and precision demands on the nanoscale in order to operate with high throughput and efficiency. Reluctance actuators, which offer greater acceleration and force output than conventional Lorentz actuators, are one option. The photolithography technique uses a floating stage with air bearings to reduce friction; nonetheless, vibration transfer is not completely prevented, potentially causing misalignment and asymmetries between the actuator components. The output force can be significantly impacted by unequal offsets between the mover and stator. In the paper that follows, a technique for calculating the force of various asymmetrical instances for the C-core reluctance actuator is demonstrated. This paper looks into the effect of rotational offsets in all rotational degrees of freedom occurring simultaneously. Previously, only each degree of freedom was analyzed. Analytical models are developed and compared to Comsol Multiphysics (COMSOL) simulations, and experimental findings show accuracy to be within almost 10% for the ranges examined. The findings presented can allow for future control systems to be designed to counteract multi-axial asymmetric issues.

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