FORC+ analysis of perpendicular magnetic tunnel junctions

Abstract

We have studied magnetic tunnel junction (MTJ) thin-film stacks using the First Order Reversal Curve (FORC) method. The FORC distribution of these MTJs has very sharp features, unlike most particulate systems or patterned films. These features are hard to study using conventional FORC analysis programs that require smoothing because this washes out the features. We have used a new analysis program (FORC+) that is designed to distinguish fine-scale features from noise without the use of smoothing, to identify these features and gain information about the switching mechanism of the stack.