Abstract
ABSTRACTThe use of focussed ion beam milling combined with high resolution scanning electron microscopy analysis as a characterisation tool for thin‐film photovoltaics is reported. CdTe solar cell cross sections are examined in high detail with as‐grown and CdCl2‐treated devices being compared. Observed changes in microstructure of the thin‐film layers are related to the device performance. The CdCl2 treatment is shown to cause a reduction in the CdTe defect density at regions close to the interface and induce recrystallization of the CdS layer. Furthermore, the focussed ion beam technique is shown to reveal voids formed within the device's thin‐film layers at various processing stages that have not been previously observed in working cell structures. The back‐contacting Te‐rich layer resulting from nitric–phosphoric acid etching is also observed, with the etched layer being seen to propagate down the CdTe grain boundaries. Copyright © 2011 John Wiley & Sons, Ltd.
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