Abstract
AbstractWe have developed and successfully demonstrated a protocol for mounting and electrical grounding of a butterfly wing scale using a series of localized electron- and ion-beam assisted Pt depositions in the dual-beam Focused Ion Beam (FIB)-SEM system. This method eliminates introduction of silver paint or other typical mounting materials, along with their chemistries, and produces a stable structure for FIB cross-sectioning, electron imaging, chemical analysis by Energy Dispersive Spectrometry (EDS) and/or Auger Electron Spectroscopy (AES), and FIB milling for 3-D reconstruction.
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