FOCUS: an experimental environment for fault sensitivity analysis

Abstract

FOCUS, a simulation environment for conducting fault-sensitivity analysis of chip-level designs, is described. The environment can be used to evaluate alternative design tactics at an early design stage. A range of user specified faults is automatically injected at runtime, and their propagation to the chip I/O pins is measured through the gate and higher levels. A number of techniques for fault-sensitivity analysis are proposed and implemented in the FOCUS environment. These include transient impact assessment on latch, pin and functional errors, external pin error distribution due to in-chip transients, charge-level sensitivity analysis, and error propagation models to depict the dynamic behavior of latch errors. A case study of the impact of transient faults on microprocessor-based jet-engine controller is used to identify the critical fault propagation paths, the module most sensitive to fault propagation, and the module with the highest potential for causing external errors. >