Abstract
An analytical technique is described for finding the best focal surfaces for offset-fed dual-reflector antennas. A ray tracing procedure traces the loci of rays incident on the main reflector onto a plane or ‘screen’ situated perpendicular to a central ray of the antenna system. Given, then, by computer graphics, the best feed locations for azimuth and elevation plane patterns, an aperture diffraction method is used which can compute the sidelobe levels and beamwidths resulting from aperture phase errors on scanned or multi-beam patterns. High-magnification Cassegrain or Gregorian antennas, with tilt angles optimised according to Japanese criteria, produce excellent radiation diagrams many beamwidths from the central, unaberrated pattern direction.
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