Abstract
Image formation of focal modulation microscopy with annular aperture (AFMM) is presented. The spatial resolution is discussed. Compared with confocal microscopy, AFMM can simultaneously enhance the axial and transverse resolution. By adjusting the width of the annular objective aperture, AFMM can be adjusted from best spatial resolution performance to highest signal level. The capability of background rejection is also investigated, showing AFMM has the potential to further increase the imaging penetration depth. Finally, an optimal configuration of AFMM is elaborated.
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