Abstract
Ferromagnetic resonance linewidth, Δ H, of polycrystalline Ta50 Å/Ni 80Fe 20/Ta50 Å films and patterned sandwich structures (NiFeCo60 Å/Cu30 Å/NiFeCo30 Å) of submicron size was studied. Δ H ∥ is found to be in the range of 32–41 Oe for single-layer films with thickness larger than 100 Å, which seems to be mainly due to intrinsic damping. For films thinner than 100 Å, Δ H ∥ increases sharply, approaching a peak around 50 Å and then drops. For patterned films, Δ H ∥ is found to increase with the decrease of element size. Magnetization measurements show a similar trend between coercivity and the element size.
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