Abstract
We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. This approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.
Highlights
We report an experimental ptychography measurement performed in fly-scan mode
By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns
This approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems
Summary
We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. This approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems. A recent algorithm development[33] pointed out that the blurry diffraction data, caused by incoherent light sources, dynamic sample systems[34] or background noises and point spread functions of detectors[35], can be reconstructed by including multiple mutually incoherent probe modes representing incoherent illumination, and(or) multiple transmission functions as object modes representing different sample states, and constraining the summation of diffraction intensities from all probe and object mode pairs to intensity measurements
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