Abstract

Epoxy resin is extensively used in gas insulated switches as a renewable energy coating due to its exceptional insulation, mechanical characteristics, and environmental friendliness. The higher resistivity of the epoxy resin causes numerous surface charges to accumulate on the surface of the epoxy resin as a result of carrier injection due to the high DC electric field, which may cause insulation failure of the power transmission system. In this study, various concentrations of epoxy resins blended with nano-alumina (nano-Al2O3) at 0 wt%, 1 wt%, 3 wt%, and 5 wt% were created. Afterwards, the epoxy resin and Al2O3 nanocomposites were fluorinated by utilizing a combination of F2 and N2 with a ratio of 20% F2 at 0.05 MPa while maintaining the temperature at 40 °C. In order to improve dispersion, nano- Al2O3 was treated with a silane coupling agent called γ-aminopropyltriethoxysilane (KH550). Additionally, infrared spectroscopy based on the Fourier transform was used to investigate the structure of chemical bonds. Furthermore, the changes in the molecular chains were verified by the FTIR spectra. The DC breakdown strength of epoxy resin\Al2O3 nano-composites showed that breakdown strength significantly improved after gas-phase fluorination. Moreover, 1 wt% nano- Al2O3 showed a higher breakdown strength. The fluorinated layer had a charge-suppressing effect, reducing the charge injected into the polymer matrix of the epoxy-resin matrix and increasing its DC breakdown capability. Thermally stimulated current (TSC) measurements indicate that epoxy resin’s trap energy and trap density are altered by nano- Al2O3 incorporation and fluorination treatment (gas-phase). It was also observed that introducing nano- Al2O3 at a lower concentration (e.g., 1 wt%) can hinder the growth of space charge in the polymer matrix of the epoxy resin, thus enhancing the deep traps’ energy. Furthermore, a fluorination layer containing a strong polarization of C-F bonding would seize the charge injection from electrodes, thus decreasing the conductivity and suppressing the charge injection.

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