Abstract
Simulated annealing, a nonlinear parameter estimation method, is used to address the problem of biexponential decay law determinations. With a laboratory-constructed fluorometer using a nitrogen-pumped dye laser as a source of very short light pulses and a photomultiplier tube whose output is sampled by a boxcar averager, the distribution of noise in the data may not be assumed to be normal and the noise level may be relatively high. Perhaps for these reasons the traditional means of data analysis sometimes falls
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