Abstract
Low-frequency (flicker) noises of the intensity and frequency of diode laser (DL) radiation have been studied. A model of DL flicker noise and a method for minimizing flicker noise at which the relative photocurrent noise can be registered at a level of 5 × 10–7 with an averaging time of 100 ms are proposed. The results obtained can be used in the development of DL-based gas-analytical equipment for measuring low gas concentrations.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
