Flicker (1/f) Noise of YBCO Grain Boundary DC SQUIDs

Jian Chen,Tsutomu Yamashita,Hiroaki Myoren,Akinobu Irie,Tomoya Ogawa,Kensuke Nakajima,Hiroyuki Nakamura,Gin-ichiro Oya

doi:10.1007/978-4-431-68266-0_250

Flicker (1/f) Noise of YBCO Grain Boundary DC SQUIDs

Jian Chen, Tsutomu Yamashita + Show 6 more

https://doi.org/10.1007/978-4-431-68266-0_250

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Publication Date: Jan 1, 1994

Affiliation: Tohoku University, Utsunomiya University

#Superconducting Quantum Interference Devices #DC Superconducting Quantum Interference Devices + Show 8 more

Abstract
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Abstract

We have studied flicker (1/f) noise of YBa2Cu3O7−δ (YBCO) DC superconducting quantum interference devices (SQUIDs) on SrTiO3 (STO) bicrystal substrates. Measured 1/f flux noise by changing the operated temperature (T) and bias current (IB) at 77K is almost constant. These facts imply that the 1/f noise mainly results from fluctuations of the critical current of the Josephson junction that formed the SQUID. Also, we explain the critical current fluctuations in the junction by an equilibrium temperature fluctuations model.

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