Flexible resistive memory device with egg-albumen/HfO x hybrid bilayer: fabrication and modeling of its switching variations

Abstract

Egg-albumen, a natural polymer, in bilayer combination with ultrathin HfO x is explored as an active switching layer component in flexible resistive random access memory devices. The fabricated devices have shown excellent switching characteristics with a current on/off ratio of greater than 104, stable retention of both low resistance and high resistance states, reliable multiple cycle switching, and very low switching power (with set power as 0.5 µW and reset power as 3.1 mW). To investigate the electro-mechanical stability, devices were bent with different bending radii and it was found that negligible degradation in device performance was observed until a 5 mm bending radius. Furthermore, a simple mathematical model is used to simulate the devices’ characteristics and the values of fitting parameters were extracted with a root mean square error of less than 4.5%. Moreover, a switching variation was introduced by utilizing variations of the physical parameters, and a near practical physics based mathematical device model was demonstrated which can enable the strengthening of simulation capabilities for exploration of unique flexible resistive memory devices and related circuits.