Abstract
AbstractOnly what you can measure, you can produce. This often quoted statement aptly describes the area of aspheric lenses production in its interplay of progress in fabrication technology and metrology. Nowadays not only the pure feasibility is in focus, but also economical factors: higher flexibility, high measurement speed and high lateral resolution, ideally all combined with a low measurement uncertainty. In this context, we discuss the recently proposed tilted wave interferometer (TWI, Fig. 1), an approach to interferometrically measure steep aspheres and freeforms within a few seconds.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
