Abstract
For spectral filters with subnanometer bandwidth, precise control of the device components’ dimensions (error<λ/1000, where λ is the center wavelength) is critical. Theoretical results from the transfer-matrix method show that an electro-optic thin-film filter can have a subnanometer bandwidth and still tolerate a root-mean-square error in the thickness of each layer up to λ/100. Illustrative examples of an electro-optic thin-film spectral filter with 0.05-nm (6-GHz), −3-dB bandwidth are presented.
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