Abstract
The effect of large, flat diffuse samples on integrating sphere measurements is calculated exactly, based on an extension of the integral equation formalism of Jacquez and Kuppenheim [ J. Opt. Soc. Am.45, 460 ( 1955)]. The theory is further extended to include the effect of a limited detector field of view, and examples for different sphere configurations are provided. A variation of Taylor’s method for absolute reflectance measurements is presented that has the advantage of an improved signal-to-noise ratio.
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