Abstract
Reliability test results of data retention and total ionizing dose (TID) in 65 nm Flash-based field programmable gate array (FPGA) are reviewed. Long-chain inverter design is recommended for reliability evaluation because it can detect degradations of both programmable and erased Flash cells. All the reliability issues are unified and modeled by one natural decay equation.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
