Flash analog-to-digital converter operational in an ultra wide temperature range (room temperature to 4.2 K) in standard CMOS technology using a cryogenic reset switching scheme

Abstract

This work presents the design and test result of a standard 0.7 μm CMOS flash analog-to-digital converter (ADC) operational in an ultra wide temperature range (UWT, room temperature down to 4.2 K). To maintain the circuit’s performance over the UWT range in the presence of temperature induced transistor anomalies, dedicated topology and switching schemes are utilized. Test results mentioned in this text are from a single process run, no design iterations were made.