Fitting a Restricted Asymmetric Dissimilarity Model to a Symmetric Dissimilarity Matrix

Abstract

This paper proposes a model to analyze the symmetric dissimilarity matrix by an Euclidean distance model with additional terms. The proposed model is a restricted model of Weeks and Bentler’s model. The symmetric dissimilarity is assumed to be induced from asymmetric dissimilarities. A Monte Carlo simulation study conducted demonstrated that the proposed least squares algorithm was effective in recovering the true number of dimensions and true configuration. This algorithm was applied to the real data set. The local minimum problem is discussed.