Abstract

The projector-augmented plane wave potentials method under the density functional theory (DFT ) was used to calcu-late the electronic structure of perfect and native point defective β-FeSi2 crystal. The calculated band structure shows that the band gap of perfect crystal is about 0.74eV, which is a little smaller than the experimental of about 0.9eV. The density of states results predicts that β-FeSi2 with Fe vacancies behaves n-type, and that with Si vacancies will shows p-type, which is in accordant with the experimental results.

Highlights

  • In recent years there has been an increasing effort in the development of new silicon based optoelectronic materials due to their possible implementation in integrated opto- and micro-electronic devices

  • Due to its luminescent properties corresponding to a direct band gap of about 0.875eV and strong optical absorption ( α=105cm-1), β-FeSi2 is an attractive silicon based optoelectronic materials expected for use in optoelectronic device applications such as infrared detectors or light emitters integrated in silicon technology [1,2,3]

  • Our calculations are performed based on the density functional theory (DFT) within the generalized gradient approximation implemented in the VIENNA AB INITIO

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Summary

Introduction

In recent years there has been an increasing effort in the development of new silicon based optoelectronic materials due to their possible implementation in integrated opto- and micro-electronic devices. Due to its luminescent properties corresponding to a direct band gap of about 0.875eV and strong optical absorption ( α=105cm-1), β-FeSi2 is an attractive silicon based optoelectronic materials expected for use in optoelectronic device applications such as infrared detectors or light emitters integrated in silicon technology [1,2,3]. More over high abundance of its non-toxic constituents Fe and Si. More over high abundance of its non-toxic constituents Fe and Si This opens new fields of applications, namely, high efficient solar cells, photo-detectors, and thermoelectric devices. The quality of a good thermoelectric material is usually characterized by the dimensionless figure of merit ZT [4], which is defined as

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