Abstract
Co/Pd magnetic multilayers have been prepared by using a sputtering method. Lattice distances and magnetic hysteresis curves have been measured by X-ray diffraction (XRD) measurements and magnetization measurements using a vibrating sample magnetometer (VSM). The XRD measurements have shown that the samples with thinner Pd layers have shorter lattice distances, and the VSM measurements have shown that the samples of thinner Co and thicker Pd layers are closer to those of perpendicular magnetic anisotropy. We have applied the X-ray magnetic diffraction method to the Co/Pd multilayer for the first time and have succeeded in observing a change in the X-ray diffraction intensities by the reversal of the magnetization direction.
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