Abstract
The effect of finite sample size on the Kondo resistance anomaly has been explored in the CuCr system. The resistivity of thin CuCr films was studied as a function of width from 0.5 to 20 K. The magnitude of the Kondo anomaly is significantly depressed as the film width is reduced below 10 \ensuremath{\mu}m. This length scale is consistent with the radius of the electron-spin correlation cloud, suggesting a crossover from two- to one-dimensional behavior. A concurrent decrease in the temperature of the resistivity maximum suggests a diminished interimpurity interaction strength.
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