Abstract
Finite-element analysis employing the scalar and vector H-field formulations and with the aid of the perturbation technique is used to calculate the TE-TM complex propagation characteristics of integrated optical devices in gallium arsenide, lithium niobate, and silica fiber, incorporating a lossy metal cladding. The propagation and attenuation properties of several types of metal-clad planar optical waveguide, which exhibit surface-plasmon properties for the TM polarization, are reviewed, and the modal loss caused by the metal cladding in a titanium-diffused lithium niobate electro-optic directional coupler modulator, an indium gallium arsenide phosphide-based TE-TM optical polarizer, and a submicron metal-clad silica fiber suitable for near-field optical scanning microscopy is calculated.
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