Abstract
We present systematic measurements of microwave surface resistance R s at 10 and 26 GHz of colossal magnetoresistance materials with varying thicknesses. It was found that for samples thicker than the electromagnetic skin depth, R s is proportional to ρ 1/2. ρ being the resistivity while for thinner samples, R s varies as ρ −1/2. These observations can be understood in terms of a simple model used to describe R s.
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