Abstract
Abstract Finite element analysis (FEA) models were developed to study the interaction between atomic force microscope (AFM) tips and filled rubber compounds during nano-indentation. The filled systems were represented by simple models consisting of one or two discrete hard domains in a rubber matrix in order to study how such a hard domain at or near the location of an indentation measurement affected the force-distance response. Parameters studied included domain size and shape, lateral position and depth from the indentation location, effect of sample thickness, and the ability to measure modulus variation across “rubber-particle” interfaces. The analyses showed the degree to which the underlying and adjacent sample regions influenced the force-distance response at a given location. The results identified several limitations of force imaging as a characterization technique for filled systems and suggested a basis for the development of more complex FEA models.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
