Fine-pitch glass GEM for high-resolution X-ray imaging

Abstract

We have developed a fine-pitch glass gas electron multiplier (G-GEM) for high-resolution X-ray imaging. The fine-pitch G-GEM is made of a 400 μm thick photo-etchable glass substrate with 150 μm pitch holes. It is fabricated using the same wet etching technique as that for the standard G-GEM. In this work, we present the experimental results obtained with a single fine-pitch G-GEM with a 50 × 50 mm2 effective area. We recorded an energy resolution of 16.2% and gas gain up to 5,500 when the detector was irradiated with 5.9 keV X-rays. We present a 50 × 50 mm2 X-ray radiograph image acquired with a scintillation gas and optical readout system.