Fine-Grained Identification for Large-Scale IoT Devices: A Smart Probe-Scheduling Approach Based on Information Feedback

Abstract

A large number of IoT devices access the Internet. While enriching our lives, IoT devices bring potential security risks. Device identification is one effective way to mitigate security risks and manage IoT assets. Typical identification algorithms generally separate data capture and target identification into two parts. As a result, it is inefficient and coarse-grained to evaluate the results only once the identification process is complete and then adjust the data capture strategy afterward. To solve this problem, we propose a fine-grained probe-scheduling approach based on information feedback. First, we model the probe surface as three layers for IoT devices and define their relationships. Then, we improve the policy gradient algorithm to optimize the probe policy and generate the optimal probe sequence for the target device. We implement a prototype system and evaluate it on 53,000 IoT devices across various categories to show its wide applicability. The results indicate that our approach can achieve success rates of 96.89%, 93.43%, and 83.71% for device brand, model, and firmware version, respectively, and reduce the identification time by 55.96%.