Fine-Grained Defect Diagnosis for CMOL FPGA Circuits

Jihye Kim,Hayoung Lee,Sungho Kang,Seokjun Jang

doi:10.1109/access.2020.3022027

Abstract

Nanotechnology is an important technological alternative to overcome the limitations of complementary metal-oxide-semiconductor (CMOS) technology. Various circuit implementation methods based on nanotechnology have been proposed, and their most important characteristics are a high defect ratio and defect tolerance through circuit reconfiguration. CMOS-nanowire-MOLecular (CMOL) field-programmable gate array (FPGA) circuits are advanced logic circuit structures that combine the advantages of CMOS and nanotechnology. However, researches on defect diagnosis methods for the reconfiguration of CMOL FPGA circuits are barely conducted. In this paper, efficient circuit configuration methods for defect diagnosis of the CMOL FPGA circuits are proposed to address the problem. Also, diagnosis algorithms for both stuck-at open and stuck-at close defects are introduced. Experimental results show that with the proposed methods, diagnosis is possible for CMOL fabrics with up to 20% stuck-at open defects and 0.02% or more stuck-at close defects.

Highlights

Lithography-based complementary metal-oxide-semiconductor (CMOS) technology is facing physical limitations owing to the increase in the complexity of electronic devices and the decrease in supply power [1]
Experiments were conducted by changing the CMOL fabric size from 5 × 5 to 30 × 30 depends on cases
Circuit configuration methods for a diagnosis independent of functional circuit configuration and diagnosis algorithms based thereon were proposed for an efficient defect diagnosis of CMOL fieldprogrammable gate array (FPGA) with a high defect ratio

Summary

INTRODUCTION

Lithography-based complementary metal-oxide-semiconductor (CMOS) technology is facing physical limitations owing to the increase in the complexity of electronic devices and the decrease in supply power [1]. In [20], [21], defect testing with built-in selftest (BIST) methods has been proposed for nanofabrics These methods and traditional CMOS-based programmable logic array (PLA) test and diagnosis techniques [22]–[24] can be modified and applied to nano-PLAs. researches on test and diagnostic methods considering the structural characteristics of CMOL circuits do not exist. All the defect types that can occur in the nano-crosspoint (hereinafter referred to as crosspoint), nanocrossbar (hereinafter referred to as crossbar), and CMOS layer should be modeled, and accurate diagnostic algorithms to find defect types and locations in the overall CMOL FPGAs are required This is the first research to find the location of defects through circuit configurations that reflect the structural characteristics of CMOL FPGAs. In this paper, fine-grained diagnostic methods for cellbased CMOL FPGAs are proposed to diagnose the type and location of defects in crosspoints accurately using efficient diagnostic logic mapping.

BACKGROUND

EXPERIMENTAL RESULTS

CONCLUSION