Abstract
A comparison of Josephson voltage standards (JVS) between the National Institute of Standards and Technology (NIST) and the Centro Nacionalde Metrología (CENAM) held at CENAM from 21 to 23 March 2006 is reported. The comparison was made at the 10 V level by measuring four Zener references using the JVS of CENAM and the transportable Compact Josephson Voltage Standard (CJVS) of NIST. The difference between the measurements was –34.7 nV with an uncertainty of 43.2 nV at 95% level of confidence.Main text.To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database kcdb.bipm.org/.The final report has been peer-reviewed and approved for publication by the CCEM, according to the provisions of the CIPM Mutual Recognition Arrangement (MRA).
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