Abstract
Epitaxial LaMnOy thin films have been grown on LaAlO3 (001)/(011)/(111) substrates using an off-axis magnetron sputtering technique. The influence of the substrate orientation on the structural, magnetic and transport properties has been investigated systematically. The lattice constants, lattice mismatch, surface roughness and resistivity of annealed films increase in the order (111)<(011)<(001). The surface morphology of the (011) oriented films exhibits a striped structure. The paramagnetic-ferromagnetic transition temperature (Tc), resistivity transition temperature (Tp), and magnetoresistance (MR) of the annealed films increase in the order (001) < (011) < (111). Compared to unannealed films, the oxygen annealing decreases MR and resistivity, and increases Tp in the order (111)<(011)<(001). These demonstrate that film orientation can dramatically affect microstructural, magnetic and transport properties of LaMnOy thin films.
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