Abstract
Isochronal and isothermal annealing curves of the reversible structural relaxation chemical short-range order, in amorphous Cu50Ti50 with and without field (or current) stress are obtained by the resistometric method. The isochronal curves under field are simply compared with those that have undergone the usual furnace annealing. On the other hand, the data of the isothermal curves are analysed in terms of the activation energy spectrum model of two-level systems. The result for two groups of these curves suggests that the reversible structural relaxation is accelerated by power annealing (E=5-50 V m-1 corresponding to J=179-1751 A cm-2).
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