Abstract

The I-V characteristics of a diamond particle deposited by hot-filament chemical vapor deposition on a tungsten tip was measured in a dual-probe scanning electron microscope (DP-SEM) chamber by introducing Mo tips into the chamber as a measurement probe. The I-V characteristic of well crystallized diamond particle follows Ohm's law, and no field electron emission was observed, while the cauliflower-like particle satisfies the Pool-Frenkel (PF) theory and the field emission was observed clearly. These results are contributed to the defects in CVD diamond.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call