Abstract

The purpose of this chapter is to present simple graphical methods for analyzing the reliability of repairable systems. Many talks and papers on repairable systems analysis deal primarily with complex parametric modeling methods. Because of their highly esoteric nature, such approaches rarely gain wide acceptance into the reliability monitoring practices of a company. This chapter will present techniques based on non-parametric methods that have been successfully used within Sun Microsystems to transform the way reliability of repairable systems is analyzed and communicated to management and customers. Readers of the chapter will gain the ability analyze a large dataset of repairable systems, identify trends in the rates of failures, identify outliers, causes of failures, and present this information using a series of simple plots that can be understood by management, customers and field support engineers alike.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.