Abstract
A very concise field-calibrated electro-optic probe using interference of modulated beams is presented. A model for interferometric electro-optic sensing with a sensor probe is proposed, utilizing the interference fringing slopes and field-induced electro-optic phase retardations. The sensing dynamic range is experimentally explored by investigating the modulation slopes and retardations with respect to the probe beam's polarizations. The probe shows a dynamic range ≥45 dB over the microstrip lines. This sensitivity is acceptable for realizing electric field imaging of radiative electronic devices. The absolute sensitivity of the probe is also determined with a micro-TEM cell that generates accurate electric fields with calculable strength for probe calibrations.
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