Abstract
The results of extensive neutron reflectometry studies of EuS-based ferromagnetic semiconductor superlattices (SL's) which exhibit interlayer exchange coupling (IEC) are presented. The SL's grown on two different substrates, (0 0 1)KCl and (1 1 1)BaF 2, with two types of nonmagnetic spacer material, PbS (narrow gap) and YbSe (wide gap semiconductor), were investigated. Neutron reflectometry measurements revealed pronounced antiferromagnetic IEC in the systems grown on (0 0 1)KCl substrate, whereas in the EuS/PbS superlattices grown on (1 1 1)BaF 2 a ferromagnetic IEC has been found. The in-plane magnetic anisotropy and the population of the magnetic domains were studied by polarized neutron reflectivity. The in-plane directions of easy-axes has thus been determined in the all investigated systems. A nonuniform distribution of domains magnetization directions among the easy in-plane axes has been found.
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