Abstract
Epitaxial growth of ferromagnetic Rh2Mn5Bi4 thin films from the family of X2Mn5Bi4 (X = Cu, Ni, Pd and Rh) compounds was pursued employing magnetron sputtering on MgO(001) substrates. Composition, structure and microstructure of prepared films were studied using a wide range of diffraction, microscopy and spectroscopy techniques, while Superconducting quantum interference device and Magneto-Optical Kerr Effect were used for magnetic and magneto-optical characterizations. The huge difference between Rh and Bi in their physicochemical properties - melting points, vapor pressures and deposition yields - manifested in a substantial influence of growth temperature on resulting properties of prepared films. Rh2Mn5Bi4 alloy with characteristic microstructure and favorable ferromagnetic and magneto-optical response was obtained after growth at 400 °C. The arrangement of Mn atoms within the structure should give rise to the magnetic moment in a similar fashion as in Heusler alloys. Curie temperature of these films was found to be 270 K. The films appear to be promising for magnetic or spintronic applications.
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